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Beilstein J. Nanotechnol. 2016, 7, 197–208, doi:10.3762/bjnano.7.18
Figure 1: The reduced frequency of the quartz crystal for the different overtones measured (overtones ν = 3, ...
Figure 2: AFM images and height profiles taken along the diagonal of the images for multilayers (PDADMAC + PS...
Figure 3: (a) Weight fraction of water as a function of N, obtained following the methodology proposed by Vör...
Figure 4: (a) Multilayer thickness of (PDADMAC + PSS)N films formed at an ionic strength of 0.10 M as a funct...
Figure 5: (a) Dependence on the salt concentration of the atomic fraction of nitrogen in (PDADMAC + PSS)N fil...
Figure 6: (a) Variation of thickness, obtained using ellipsometry for the adsorption of single layers, as a f...
Figure 7: Atomic ratios obtained from XPS measurements at an angle of electron emission of 0°. (a) Ratios of ...
Figure 8: (a) Changes in the surface potential, ΔV, as a function of N for (PDADMAC + PSS)N films formed at d...